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17ava Conferencia Mundial sobre Pruebas no Destructivas 2008

septiembre 22, 2008

Spellman High Voltage Electronics Corp. y Spellman High Voltage (SIP) Co. Ltd. se enorgullece en anunciar que estará presente en la próxima 17 ª Conferencia Mundial sobre pruebas no destructivas, que se celebrará del 25 al 28 de oct, 2008 en Shanghai,China, en el Centro de Exposiciones de Shanghai, stand C355.

2008 17th World Conference on Nondestructive Testing

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